CD4511BMS Datasheet, PDF (5/11 Pages) Intersil Corporation – CMOS BCD-to-7-Segment Latch Decoder Drivers

Specifications CD4511BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS(Continued)
LIMITS
PARAMETER
Output Drive Voltage
SYMBOL
CONDITIONS
LVOH15 VDD = 15V, IOH = -10mA
Input Capacitance
VDD = 15V, IOH = -20mA
VDD = 15V, IOH = -25mA
CIN Any Input
NOTES
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
TEMPERATURE
+25^oC
+125^oC
-55^oC
+125^oC
-55^oC
+25^oC
-55^oC
+25^oC
MIN
14.0
14.0
13.9
13.5
13.75
13.5
13.65
-
MAX
-
-
-
-
-
-
-
7.5
UNITS
V
V
V
V
V
V
V
pF
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
Propagation Delay Time
SYMBOL
CONDITIONS
IDD VDD = 20V, VIN = VDD or GND
VNTH VDD = 10V, ISS = -10µA
∆VTN VDD = 10V, ISS = -10µA
VTP
∆VTP
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
F
TPHL
TPLH
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
VDD = 5V
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 4
1, 4
1, 4
TEMPERATURE MIN
+25^oC
-
+25^oC
-2.8
+25^oC
-
1, 4
+25^oC
0.2
1, 4
+25^oC
-
1
1, 2, 3, 4
+25^oC
+25^oC
VOH >
VDD/2
-
3. See Table 2 for +25^oC limit.
4. Read and Record
MAX
25
-0.2
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25^oC
Limit
UNITS
µA
V
V
V
V
V
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25^oC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-2
Output Current (Sink)
Output Current (Source)
IDD
IOL5
IOH5A
± 1.0µA
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
Interim Test 2 (Post Burn-In)
TABLE 6. APPLICABLE SUBGROUPS
MIL-STD-883
METHOD
GROUP A SUBGROUPS
100% 5004
1, 7, 9
100% 5004
1, 7, 9
100% 5004
1, 7, 9
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
7-1173