CD4063BMS Datasheet, PDF (5/8 Pages) Intersil Corporation – CMOS 4-Bit Magnitude Comparator

Specifications CD4063BMS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
METHOD
GROUP A SUBGROUPS
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 5% parametric, 3% functional; cumulative for static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
TEST
METHOD
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9, Deltas
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
Static Burn-In 1
5-7
Note 1
1, 2, 4, 8-15
3, 16
Static Burn-In 2
5-7
Note 1
3, 8
1, 2, 4, 9-16
Dynamic Burn-
-
1, 2, 4, 8, 10, 11,
3, 16
In Note 1
13
5-7
12, 15
9, 14
Irradiation
5-7
Note 2
3, 8
1, 2, 4, 9-16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
= 10V ± 0.5V
VDD
A0 A1 A2 A3
A4 A5 A6 A7
CD4063
(A < B) IN
(A = B) IN
(A > B) IN
(A < B) OUT
(A = B) OUT
(A > B) OUT
CD4063
A8 A9 A10 A11
CD4063
B0 B1 B2 B3
B4 B5 B6 B7
B8 B9 B10 B11
tP TOTAL = tP (COMPARE INPUTS) + 2 x tP (CASCADE INPUTS), AT VDD = 10V
(3 STAGES)
= 250 + (2 x 200) = 650ns (TYP.)
FIGURE 1. TYPICAL SPEED CHARACTERISTICS OF A 12-BIT COMPARATOR
7-962