CD4041BMS Datasheet, PDF (5/7 Pages) Intersil Corporation – CMOS Quad True/Complement Buffer

CD4041UBMS
TABLE 6. APPLICABLE SUBGROUPS (Continued)
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
5005
TEST
PRE-IRRAD
POST-IRRAD
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9, Deltas
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
Static Burn-In 1 1, 2, 4, 5, 8, 9, 11, 3, 6, 7, 10, 13
14
(Note 1)
12
Static Burn-In 2 1, 2, 4, 5, 8, 9, 11,
7
(Note 1)
12
3, 6, 10, 13, 14
Dynamic Burn-
-
In (Note 2)
7
14
1, 2, 4, 5, 8, 9, 11,
3, 6, 10, 13
12
Irradiation
1, 2, 4, 5, 8, 9, 11,
7
(Note 3)
12
3, 6, 10, 13, 14
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 4.75K ± 5%; VDD = 18V ± 0.5V
3. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V ±
0.5V
Typical Performance Characteristics
AMBIENT TEMPERATURE (T_A) = +25^oC
70
GATE-TO-SOURCE VOLTAGE (VGS) = 15V
60
50
10V
40
30
20
5V
10
0 1 2 345 678
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)
FIGURE 2. TYPICAL OUTPUT LOW (SINK) CURRENT
CHARACTERISTICS
AMBIENT TEMPERATURE (T_A) = +25^oC
70
60
GATE-TO-SOURCE VOLTAGE (VGS) = 15V
50
40
30
10V
20
10
5V
0 1 2 345 678
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)
FIGURE 3. MINIMUM LOW (SINK) CURRENT CHARACTERIS-
TICS
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