CD40160BMS Datasheet, PDF (5/13 Pages) Intersil Corporation – CMOS Synchronous Programmable 4-Bit Counters

CD40160BMS, CD40161BMS, CD40162BMS, CD40163BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Minimum Clear Removal
Time
(CD40160BMS,
CD40161BMS)
SYMBOL
CONDITIONS
TREM VDD = 5V
VDD = 10V
VDD = 15V
NOTES
1, 2, 3
1, 2, 3
1, 2, 3
TEMPERATURE MIN
+25^oC
-
+25^oC
-
+25^oC
-
MAX
200
100
70
UNITS
ns
ns
ns
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized on initial
design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
4. If more than one unit is cascaded, TRCL should be made less than or equal to the sumof the transition time and the fixed propagation delay of
the output of the driving stage for the estimated capacitive load.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
Supply Current
IDD VDD = 20V, VIN = VDD or GND
N Threshold Voltage
VNTH VDD = 10V, ISS = -10µA
N Threshold Voltage Delta ∆VTN VDD = 10V, ISS = -10µA
P Threshold Voltage
VTP VSS = 0V, IDD = 10µA
P Threshold Voltage Delta ∆VTP VSS = 0V, IDD = 10µA
Functional
F
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Propagation Delay Time
TPHL VDD = 5V
TPLH
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 4
1, 4
1, 4
1, 4
1, 4
1
TEMPERATURE
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
1, 2, 3, 4
+25^oC
3. See Table 2 for +25^oC limit.
4. Read and Record
LIMITS
MIN
MAX
-
25
-2.8
-0.2
-
±1
0.2
2.8
-
±1
VOH > VOL <
VDD/2 VDD/2
-
1.35 x
+25^oC
Limit
UNITS
µA
V
V
V
V
V
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25^oC
PARAMETER
Supply Current - MSI-2
Output Current (Sink)
Output Current (Source)
SYMBOL
IDD
IOL5
IOH5A
DELTA LIMIT
± 1.0µA
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
4-5