82C82 Datasheet, PDF (4/7 Pages) Intersil Corporation – CMOS Octal Latching Bus Driver

82C82
Absolute Maximum Ratings
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8.0V
Input, Output or I/O Voltage . . . . . . . . . . . . GND-0.5V to V_CC +0.5V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range
C82C82. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0^oC to +70^oC
I82C82 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40^oC to +85^oC
M82C82 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55^oC to +125^oC
Thermal Information
Thermal Resistance (Typical)
CERDIP . . . . . . . . . . . . . . . . . . . . . . . .
CLCC. . . . . . . . . . . . . . . . . . . . . . . . . .
θ_JA
75^oC/W
85^oC/W
θ_JC
18^oC/W
22^oC/W
PDIP . . . . . . . . . . . . . . . . . . . . . . . . . . 75
N/A
PLCC . . . . . . . . . . . . . . . . . . . . . . . . . . 75
N/A
Storage Temperature Range . . . . . . . . . . . . . . . . . .-65^oC to +150^oC
Maximum Junction Temperature
Ceramic Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175^oC
Plastic Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +150^oC
Minimum Lead Temperature (Soldering 10s) . . . . . . . . . . . . +300^oC
(PLCC Lead Tips Only)
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65 Gates
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DC Electrical Specifications V_CC = 5.0V ±10%;
T_A
T_A
T_A
=
=
=
0^oC to +70^oC (C82C82);
-40^oC to +85^oC (I82C82);
-55^oC to +125^oC (M82C82)
SYMBOL
PARAMETER
MIN
MAX
UNITS
TEST CONDITIONS
V_IH
Logical One Input Voltage
2.0
-
V
C82C82, I82C82 (Note 1)
2.2
-
V
M82C82 (Note 1)
V_IL
Logical Zero Input Voltage
-
0.8
V_OH
Logical One Output Voltage
2.9
-
V_CC -0.4V
-
V_OL
Logical Zero Output Voltage
-
0.4
II
Input Leakage Current
-1.0
1.0
IO
Output Leakage Current
-10.0
10.0
V
V
I_OH = -8mA, OE = GND
V
I_OH = -100µA, OE = GND
V
I_OL = 8mA, OE = GND
µA
V_IN = GND or V_CC, DIP Pins 1-9, 11
µA
V_O = GND or V_CC, OE ≥ V_CC -0.5V
DIP Pins 12-19
ICCSB Standby Power Supply Cur-
-
rent
ICCOP Operating Power Supply
-
Current
10
µA
V_IN = V_CC or GND, V_CC = 5.5V, Outputs Open
1
mA/MHz T_A = +25^oC, V_CC = 5V, Typical (See Note 2)
NOTES:
1. V_IH is measured by applying a pulse of magnitude = V_IH min to one data input at a time and checking the corresponding device output
for a valid logical “1” during valid input high time. Control pins (STB, OE) are tested separately with all device data input pins at V_CC -0.4.
2. Typical ICCOP = 1mA/MHz of STB cycle time. (Example: 5MHz µP, ALE = 1.25MHz, ICCOP = 1.25mA).
Capacitance T_A = +25^oC
SYMBOL
PARAMETER
TYPICAL
UNITS
TEST CONDITIONS
C_IN
C_OUT
Input Capacitance
Output Capacitance
13
pF
Freq = 1MHz, all measurements are
referenced to device GND
20
pF
4-277