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ISL6232 Datasheet, PDF (21/25 Pages) Intersil Corporation – High Efficiency System Power Supply Controller for Notebook Computers
ISL6232
Input Capacitor Selection
The input capacitors must meet the input ripple current
(IRMS) requirement imposed by the switching current. The
ISL6232 dual switching regulators operate at the same
switching frequency with out-of-phase. This interleaves the
current pulses drawn by the two regulators and have no
overlap time at normal operation. The input RMS current is
much smaller when compared with both regulators operating
in phase or operating at different switching frequencies. The
input RMS current varies with load and the input voltage.
The maximum input capacitor RMS current for a single buck
regulator is given by Equation 16:
Irms=
IO
U
T
-----V----O----U-----T---(---V----I--N-----–-----V----O----U-----T----)
VIN
(EQ. 16)
when VIN = 2VOUT (D = 50%), IRMS has maximum current
of IOUT/2. The ESR of the input capacitor is important for
determining capacitor power dissipation. All the power
(I2RMS x ESR) heats up the capacitor and reduces
efficiency. Non-tantalum chemistries (ceramic, polymer such
as POSCAP, or SPCAP) are preferred due to their low ESR
and resilience to power-up surge currents. Choose input
capacitors that exhibit less than +10°C temperature rise at
the RMS input current for optimal circuit longevity.
MOSFET Selection
The synchronous buck regulator has the input voltage from
either AC-adapter output or battery output. The maximum
AC-adapter output voltage does not exceed 24V while the
maximum battery voltage does not exceed 17V for a 4 series
Li-ion battery cell battery pack. Therefore, a 30V logic
MOSFET should be used.
The high side MOSFET must be able to dissipate the
conduction losses plus the switching losses. The input
voltage of the synchronous regulator is equal to the
AC-adapter output voltage or battery voltage. The maximum
efficiency is achieved by selecting a high side MOSFET that
has the conduction losses equal to the switching losses.
Ensure that the ISL6232 LGATE gate driver can supply
sufficient gate current to prevent it from conduction,
otherwise, cross-conduction problems may occur.
Conduction is due to the injected current into the
drain-to-gate parasitic capacitor (Miller capacitor Cgd)
caused by the voltage rising rate at phase node during the
moment of the high-side MOSFET turn-on. Reasonably
slowing turn-on speed of the high-side MOSFET by
connecting a resistor between the BOOT pin and gate drive
supply source, and high sink current capability of the
low-side MOSFET gate driver, helps reduce the possibility of
cross-conduction.
For the high-side MOSFET, the worst-case conduction
losses occur at the minimum input voltage as shown in
Equation 17:
PQ1, Conduction
=
V-----O----U----T--
VIN
IO2 UT
rD
S
(
ON)
(EQ. 17)
The optimum efficiency occurs when the switching losses
equal the conduction losses. However, it is difficult to
calculate the switching losses in the high-side MOSFET
since it must allow for difficult-to-quantify factors that
influence the turn-on and turn-off times. These factors
include the MOSFET internal gate resistance, gate charge,
threshold voltage, stray inductance, and the pull-up and
pull-down resistance of the gate driver. The following
switching loss calculation (Equation 18) provides a rough
estimate.
PQ1, Switching
=
1--
2
VI
N
IL
V
fs
--------Q----g----d--------
Ig, source
+
1--
2
VI
N
ILP
fs
----Q-----g---d-----
Ig, sin k
+
QrrVINfs
(EQ. 18)
where Qgd: drain-to-gate charge, Qrr: total reverse recovery
charge of the body-diode in low side MOSFET, ILV: inductor
valley current, ILP:is Inductor peak current, Ig,sink and
Ig,source are the peak gate-drive source/sink current of Q1.
To achieve low switching losses requires low drain-to-gate
charge Qgd. Generally, the lower the drain-to-gate charge,
the higher the ON-resistance. Therefore, there is a trade-off
between the ON-resistance and drain-to-gate charge. Good
MOSFET selection is based on the Figure of Merit (FOM),
which is the product of the total gate charge and
ON-resistance. Usually, the smaller the value of FOM, the
higher the efficiency for the same application.
For the low-side MOSFET, the worst-case power dissipation
occurs at minimum output voltage and maximum input
voltage:
PQ2=
⎛
⎜
⎝
1
–
V----V-O---I-U-N---T--⎠⎟⎞
IO2
U
T
rDS(O
N)
(EQ. 19)
Choose a low-side MOSFET that has the lowest possible
ON-resistance with a moderate-sized package, like SO-8,
and one that is reasonably priced. The switching losses are
not an issue for the low side MOSFET because it operates at
zero-voltage-switching.
Choose an Schottky diode, in parallel with the low side
MOSFET Q2, with a forward voltage drop low enough to
prevent the low-side MOSFET Q2 body-diode from turning
on during the dead time. This also reduces the power loss in
the high-side MOSFET associated with the reverse recovery
of the low-side MOSFET Q2 body diode. As a general rule,
select a diode with a DC current rating equal to one-third of
the load current. One option is to choose a combined
MOSFET with the Schottky diode in a single package. The
integrated packages may work better in practice because
there is less stray inductance due to short connection. This
Schottky diode is optional and may be removed if efficiency
loss can be tolerated.
21
FN9116.1
April 20, 2009