82C54 Datasheet, PDF (13/17 Pages) Intel Corporation – CHMOS PROGRAMMABLE INTERVAL TIMER

82C54
Absolute Maximum Ratings
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8.0V
Input, Output or I/O Voltage . . . . . . . . . . . . GND-0.5V to V_CC +0.5V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range
C82C54, C82C54-10, -12 . . . . . . . . . . . . . . . . . . . . 0^oC to +70^oC
I82C54, I82C54-10, -12 . . . . . . . . . . . . . . . . . . . . -40^oC to +85^oC
M82C54, M82C54-10, -12 . . . . . . . . . . . . . . . . . -55^oC to +125^oC
Thermal Information
Thermal Resistance (Typical)
θ_JA (^oC/W) θ_JC (^oC/W)
CERDIP Package . . . . . . . . . . . . . . . .
55
12
CLCC Package . . . . . . . . . . . . . . . . . .
65
14
PDIP Package . . . . . . . . . . . . . . . . . . .
60
N/A
PLCC Package . . . . . . . . . . . . . . . . . .
65
N/A
SOIC Package . . . . . . . . . . . . . . . . . . .
75
N/A
Storage Temperature Range . . . . . . . . . . . . . . . . . .-65^oC to +150^oC
Maximum Junction Temperature Ceramic Package . . . . . . . +175^oC
Maximum Junction Temperature Plastic Package. . . . . . . . . +150^oC
Maximum Lead Temperature Package (Soldering 10s) . . . . +300^oC
(PLCC and SOIC - Lean Tips Only)
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2250 Gates
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
)
DC Electrical Specifications
V_CC = +5.0V ± 10%, T_A = 0^oC to +70^oC (C82C54, C82C54-10, C82C54-12)
T_A = -40^oC to +85^oC (I82C54, I82C54-10, I82C54-12)
T_A = -55^oC to +125^oC (M82C54, M82C54-10, M82C54-12
SYMBOL
PARAMETER
MIN
MAX
UNITS
TEST CONDITIONS
VIH
Logical One Input Voltage
2.0
-
V
C82C54, I82C54
2.2
-
V
M82C54
VIL
Logical Zero Input Voltage
-
0.8
V
VOH
Output HIGH Voltage
3.0
-
V
IOH = -2.5mA
VOL
Output LOW Voltage
V_CC -0.4
-
-
0.4
V
IOH = -100µA
V
IOL = +2.5mA
II
Input Leakage Current
-1
+1
µA
VIN = GND or V_CC
DIP Pins 9,11,14-16,18-23
IO
Output Leakage Current
-10
+10
µA
VOUT = GND or V_CC
DIP Pins 1-8
ICCSB Standby Power Supply Current
-
10
µA
V_CC = 5.5V, VIN = GND or V_CC,
Outputs Open, Counters
Programmed
ICCOP Operating Power Supply Current
-
10
mA
V_CC = 5.5V,
CLK0 = CLK1 = CLK2 = 8MHz,
VIN = GND or V_CC,
Outputs Open
Capacitance T_A = +25^oC; All Measurements Referenced to Device GND, Note 1
SYMBOL
PARAMETER
TYP
UNITS
CIN
Input Capacitance
20
pF
COUT
Output Capacitance
20
pF
CI/O
I/O Capacitance
20
pF
NOTE:
1. Not tested, but characterized at initial design and at major process/design changes.
TEST CONDITIONS
FREQ = 1MHz
FREQ = 1MHz
FREQ = 1MHz
4-13