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X9410_06 Datasheet, PDF (12/21 Pages) Intersil Corporation – Dual Digitally Controlled Potentiometer
X9410
A.C. TEST CONDITIONS
Input pulse levels
Input rise and fall times
VCC x 0.1 to VCC x 0.9
10ns
Input and output timing level VCC x 0.5
Notes: (5) This parameter is periodically sampled and not 100% tested
(6) tPUR and tPUW are the delays required from the time the
third (last) power supply (VCC, V+ or V-) is stable until
the specific instruction can be issued. These parameters
are periodically sampled and not 100% tested.
Test Circuit #3 SPICE Macro Model
RTOTAL
RH
CL
RL
CH
CW
10pF
10pF
25pF
RW
AC TIMING
Symbol
fSCK
tCYC
tWH
tWL
tLEAD
tLAG
tSU
tH
tRI
tFI
tDIS
tV
tHO
tRO
tFO
tHOLD
tHSU
tHH
tHZ
tLZ
TI
tCS
tWPASU
tWPAH
Parameter
SSI/SPI clock frequency
SSI/SPI clock cycle time
SSI/SPI clock high time
SSI/SPI clock low time
Lead time
Lag time
SI, SCK, HOLD and CS input setup time
SI, SCK, HOLD and CS input hold time
SI, SCK, HOLD and CS input rise time
SI, SCK, HOLD and CS input fall time
SO output disable time
SO output valid time
SO output hold time
SO output rise time
SO output fall time
HOLD time
HOLD setup time
HOLD hold time
HOLD low to output in High Z
HOLD high to output in Low Z
Noise suppression time constant at SI, SCK, HOLD and CS inputs
CS deselect time
WP, A0 and A1 setup time
WP, A0 and A1 hold time
Min.
500
200
200
250
250
50
50
0
0
400
100
100
2
0
0
Max.
2.0
2
2
500
100
50
50
100
100
20
Unit
MHz
ns
ns
ns
ns
ns
ns
ns
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
ns
ns
12
FN8193.2
October 12, 2006