ISL71091SEH40 Datasheet, PDF (12/16 Pages) Intersil Corporation – 4.096V Radiation Hardened Ultra Low Noise,

ISL71091SEH40
Characterization vs Simulation Results
4.101
4.100
4.099
4.098
4.097
4.096
4.095
4.094
4.093
4.092
4.091
-65 -45 -25
-5 15 35 55 75
TEMPERATURE (°C)
95 115 135
4.101
4.100
4.099
4.098
UNIT 2
UNIT 3
UNIT 5 UNIT 4
UNIT 1
4.097
4.096
4.095
4.094
4.093
4.092
4.091
-65 -45 -25 -5 15 35 55 75 95 115 135
TEMPERATURE (°C)
FIGURE 24. SIMULATED (WORSE CASE) V_OUT vs TEMPERATURE
FIGURE 25. CHARACTERIZED V_OUT vs TEMPERATURE
4.106
4.104
4.102
4.100
4.098
4.096
4.094
4.092
4.090
4.088
4.086
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 26. SIMULATED LINE TRANSIENT (V_IN = 500mV)
10
8
6
4
2
0
V_OUT
-2
-4
-6
-8
-10
0
0.25 0.5.0 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 27. CHARACTERIZED LINE TRANSIENT (V_IN = 500mV)
4.176
4.160
4.144
4.128
4.112
4.096
4.080
4.064
4.048
4.032
4.016 ₀
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 28. SIMULATED LOAD TRANSIENT (I_L = 1mA)
80
60
40
20
V_OUT
0
-20
-40
-60
-80
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 29. CHARACTERIZED LOAD TRANSIENT (I_L = 1mA)
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FN8634.2
March 17, 2016