ISL55110_15 Datasheet, PDF (11/18 Pages) Intersil Corporation – Dual, High Speed MOSFET Driver

ISL55110, ISL55111
Typical Performance Curves (See “Typical Performance Curves Discussion” on page 11) (Continued)
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.0
2.5
V_H = 12.0V
680pF
330pF
3.5
4.5
5.5
V_DD (V)
FIGURE 30. tSkewR vs V_DD
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.0
2.5
V_H = 12.0V
680pF
330pF
3.5
4.5
5.5
V_DD (V)
FIGURE 31. tSkewF vs V_DD
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.0
3
V_DD = 3.3V
680pF
330pF
6
9
12
V_H (V)
FIGURE 32. tSkewR vs V_H
Typical Performance Curves
Discussion
r_ON
The r_ON source is tested by placing the device in constant drive
high condition and connecting a -50mA constant current
source to the driver output. The voltage drop is measured from
V_H to driver output for r_ON calculations.
The r_ON sink is tested by placing the device in constant driver
low condition and connecting a +50mA constant current
source. The voltage drop from driver out to ground is measured
for r_ON calculations.
Dynamic Tests
All dynamic tests are conducted with ISL55110 and ISL55111
evaluation board(s) (ISL55110_11EVAL2Z). Driver loads are
soldered to the evaluation board. Measurements are collected
with P6245 active FET Probes and TDS5104 oscilloscope.
Pulse stimulus is provided by HP8131 pulse generator.
The ISL55110 and ISL55111 evaluation boards provide test
point fields for leadless connection to either an active FET
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1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.0
3
V_DD = 3.3V
680pF
330pF
6
9
12
V_H (V)
FIGURE 33. tSkewF vs V_H
probe or differential probe. “TP - IN_A/_B” test points are used
for monitoring pulse input stimulus. “TP - OA/OB” allows
monitoring of driver output waveforms. C₆ and C₇ are the
usual placement for driver loads. R₃ and R₄ are not populated
and are provided for user-specified, more complex load
characterization.
Pin Skew
Pin skew measurements are based on the difference in
propagation delay of the two channels. Measurements are
made on each channel from the 50% point on the stimulus
point to the 50% point on the driver output. The difference in
the propagation delay for Channel A and Channel B is
considered to be skew.
Both rising propagation delay and falling propagation delay are
measured and report as tSkewR and tSkewF.
50MHz Tests
50MHz Tests reported as no load actually include evaluation
board parasitics and a single TEK 6545 FET probe. However, no
driver load components are installed and C₆ through C₉ and
R₃ through R₆ are not populated.
FN6228.8
January 29, 2015