SAL-XC866 Datasheet, PDF (99/113 Pages) Infineon Technologies AG – 8-Bit Single-Chip Microcontroller

SAL-XC866
Electrical Parameters
Table 35 ADC Characteristics (Operating Conditions apply; V_DDP = 5V Range)
Parameter
Symbol
Limit Values
Unit
min. typ . max.
Test Conditions/
Remarks
Overload current K_OVD CC –
coupling factor for
–
5.0 x –
10^-3
I_OV > 0¹⁾³⁾
digital I/O pins
–
–
1.0 x –
I_OV < 0¹⁾³⁾
10^-2
Switched
C_AREFSW –
capacitance at the
CC
reference voltage
10
20
pF
1)4)
input
Switched
C_AINSW –
capacitance at the
CC
analog voltage
5
7
pF
1)5)
inputs
Input resistance of R_AREFCC –
the reference input
1
2
kΩ
1)
Input resistance of R_AIN CC –
the selected analog
1
1.5
kΩ
1)
channel
1) _{Not subject to production test, verified by design/characterization.}
2) _{TUE is tested at VAREF = 5.0 V, VAGND = 0 V , VDDP = 5.0 V.}
3) _{An overload current (IOV) through a pin injects a certain error current (IINJ) into the adjacent pins. This error}
current adds to the respective pin’s leakage current (I_OZ). The amount of error current depends on the
overload current and is defined by the overload coupling factor K_OV. The polarity of the injected error current
is inverse compared to the polarity of the overload current that produces it. The total current through a pin is
|I_TOT| = |I_OZ1| + (|I_OV| × K_OV). The additional error current may distort the input voltage on analog inputs.
4) _{This represents an equivalent switched capacitance. This capacitance is not switched to the reference voltage}
at once. Instead of this, smaller capacitances are successively switched to the reference voltage.
5) _{The sampling capacity of the conversion C-Network is pre-charged to VAREF/2 before connecting the input to}
the C-Network. Because of the parasitic elements, the voltage measured at ANx is lower than V_AREF/2.
Data Sheet
95
V1.1, 2012-12