TLE4964-4M Datasheet, PDF (9/26 Pages) Infineon Technologies AG – High Precision Automotive Hall Effect Switch

2.4
Block Diagram
TLE4964-4M
Functional Description
Spinning Hall
Probe
Voltage
Regulator
To All Subcircuits
Bias and
Compensation
Circuits
Oscillator and
Sequencer
Amplifier
Reference
Low Pass
Filter
Comparator
with
Hysteresis
Control
Overtemperature
& overcurrent
protection
V_DD
Q
GND
Figure 2-2 Functional Block Diagram TLE4964-4M
2.5
Functional Block Description
The chopped Hall IC switch comprises a Hall probe, bias generator, compensation circuits, oscillator and output
transistor.
The bias generator provides currents for the Hall probe and the active circuits. Compensation circuits stabilize the
temperature behavior and reduce influence of technology variations.
The active error compensation (chopping technique) rejects offsets in the signal path and the influence of
mechanical stress to the Hall probe caused by molding and soldering processes and other thermal stress in the
package. The chopped measurement principle together with the threshold generator and the comparator ensures
highly accurate and temperature stable magnetic thresholds.
The output transistor has an integrated overcurrent and overtemperature protection.
Data Sheet
9
Revision 1.0, 2013-05-07