TLE4963-1M_16 Datasheet, PDF (7/17 Pages) Infineon Technologies AG – High Precision Automotive Hall Effect Latch for 5V Applications

TLE4963-1M
Functional Description
2.4
Block Diagram
Spinning Hall
Probe
Voltage
Regulator
To All Subcircuits
Bias and
Compensation
Circuits
Oscillator and
Sequencer
Amplifier
Reference
Low Pass
Filter
Comparator
with
Hysteresis
Driver
V_DD
Q
GND
Figure 3 Functional Block Diagram TLE4963-1M
2.5
Functional Block Description
The chopped Hall IC switch comprises a Hall probe, bias generator, compensation circuits, oscillator and
output transistor.
The bias generator provides currents for the Hall probe and the active circuits. Compensation circuits stabilize
the temperature behavior and reduce influence of technology variations.
The active error compensation (chopping technique) rejects offsets in the signal path and the influence of
mechanical stress to the Hall probe caused by molding and soldering processes and other thermal stress in
the package. The chopped measurement principle together with the threshold generator and the comparator
ensures highly accurate and temperature stable magnetic thresholds.
Data Sheet
7
Revision 1.0 2016-01-12