TLE7259-2GE Datasheet, PDF (25/31 Pages) Infineon Technologies AG – LIN Transceiver

TLE7259-2GE
Application Information
7
Application Information
7.1
ESD Robustness according to IEC61000-4-2
Test for ESD robustness according to IEC61000-4-2 “Gun test” (150 pF, 330 Ω) have been performed. The results
and test conditions are available in a separate test report.
Table 7 ESD Robustness according to IEC61000-4-2
Performed Test
Result Unit
Electrostatic discharge voltage at pin V_S, BUS ≥ 11
kV
versus GND
Electrostatic discharge voltage at pin V_S, BUS ≤ -11
kV
versus GND
Electrostatic discharge voltage at pin WK versus ≥ 9
kV
GND
Electrostatic discharge voltage at pin WK versus ≤ -9
kV
GND
Remarks
1)_{Positive pulse}
1)_{Negative pulse}
1)_{Positive pulse}
1)_{Negative pulse}
1) ESD susceptibility “ESD GUN” according LIN EMC 1.3 Test Specification, Section 4.3. (IEC 61000-4-2) -Tested by external
test house.
7.2
Pin Compatibility to other LIN Transceivers
The LIN Transceiver TLE7259-2GE is pin and function compatible to the Single LIN Transceivers like the
TLE7259G, the TLE7259-2GU and other single LIN Transceivers on the market. The TLE7259-2GE has no V_IO
supply pin. Therefore the TLE7259-2GE needs a pull-up resistor to the external microcontroller supply. The
TLE7259-2GE can also be used on a PCB design for the Twin LIN TLE7269G. Since the TLE7269G doesn’t need
a pull-up resistor on the RxD pin, a pull-up resistor to the external microcontroller needs to be added to get the
same functionality.
RxD1
1
14
INH1
RxD
1
8
INH
EN
2
WK
3
13
V_S
12
BUS1
EN
2
WK
3
7
V_S
6
BUS
TxD1
4
11
GND
TxD
4
5
GND
TxD2
5
V_IO
6
RxD2
7
10
BUS2
9
W2O
8
INH2
TLE7269G
TLE7259G
TLE7259-2GE
TLE7259-2GU
and other single LIN
transceivers
Figure 14 Pin configuration TLE7259-2GE, TLE7259-2GU, TLE7259G and TLE7269G
Data Sheet
25
Rev. 1.1, 2008-09-05