ICS83940DI Datasheet, PDF (8/19 Pages) Integrated Circuit Systems – LOW SKEW, 1-TO-18 LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER

ICS83940DI Data Sheet
LOW SKEW, 1-TO-18 LVPECL-TO-LVCMOS/LVTTL FANOUT BUFFER
Table 5C. AC Characteristics, V_DD = V_DDO = 2.5V ± 5%, T_A = -40°C to 85°C
Symbol Parameter
Test Conditions
f_MAX
t_PLH
Output Frequency
Propagation
Delay
PCLK, nPCLK; NOTE 1, 5
LVCMOS_CLK; NOTE 2, 5
Propagation
Delay
PCLK, nPCLK; NOTE 1, 5
LVCMOS_CLK; NOTE 2, 5
ƒ  150MHz
ƒ  150MHz
ƒ > 150MHz
ƒ > 150MHz
tsk(o)
Output Skew;
NOTE 3, 5
PCLK, nPCLK
LVCMOS_CLK
Measured on the Rising Edge
@ V_DDO/2
Part-to-Part Skew; ^{PCLK, nPCLK}
NOTE 6
LVCMOS_CLK
ƒ  150MHz
ƒ  150MHz
tsk(pp)
Part-to-Part Skew; ^{PCLK, nPCLK}
NOTE 6
LVCMOS_CLK
ƒ > 150MHz
ƒ > 150MHz
Part-to-Part Skew; ^{PCLK, nPCLK}
NOTE 4, 5
LVCMOS_CLK
Measured on the Rising Edge
@ V_DDO/2
t_R / t_F
odc
Output Rise/Fall Time
Output Duty Cycle
0.5V to 1.8V
ƒ < 134MHz
Minimum
1.2
1.5
1.5
2.0
0.3
45
Typical
Maximum
200
3.8
3.2
3.7
3.6
200
200
2.6
1.7
2.2
1.7
1.2
1.0
1.2
55
Units
MHz
ns
ns
ns
ns
ps
ps
ns
ns
ns
ns
ns
ns
ns
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: All parameters measured at 200MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output V_DDO/2.
NOTE 2: Measured from V_DD/2 to V_DDO/2.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V_DDO/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature and with equal load
conditions. Using the same type of inputs on each device, the outputs are measured at V_DDO/2.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges, and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at V_DDO/2.
ICS83940DYI REVISION C MARCH 20, 2013
8
©2013 Integrated Device Technology, Inc.