83PR226I-01 Datasheet, PDF (6/22 Pages) Integrated Device Technology – Programmable FemtoClock LVPECL Oscillator Replacement

83PR226I-01 Datasheet
Table 6B. AC Characteristics, V_CC = 2.5V ± 5%, V_EE = 0V, T_A = -40°C to 85°C
Symbol
Parameter
Test Conditions
Minimum
f_MAX
tjit(cc)
Output Frequency
Cycle-to-Cycle Jitter;
NOTE 1
83.33
tjit(Ø)
RMS Phase Jitter
(Random);
NOTE 2
156.25MHz,
Integration Range: 1.875MHz – 20MHz
125MHz,
Integration Range: 1.875MHz – 20MHz
100MHz,
Integration Range: 1.875MHz – 20MHz
t_j
(PCIe Gen 1)
Phase Jitter
Peak-to-Peak;
NOTE 3
100MHz, (1.2MHz – 21.9MHz),
10⁶ samples,
25MHz crystal input
125MHz, (1.2MHz – 21.9MHz),
10⁶ samples,
25MHz crystal input
t_{REFCLK_HF_RMS} Phase Jitter RMS;
(PCIe Gen 2) NOTE 4
100MHz, 25MHz crystal input
125MHz, 25MHz crystal input
t_R / t_F
Output Rise/Fall Time
20% to 80%
200
odc
Output Duty Cycle
47
t_LOCK
PLL Lock Time; NOTE 5
Typical
0.44
0.48
0.49
12.18
16.41
1.47
1.74
Maximum
213.33
45
700
53
100
Units
MHz
ps
ps
ps
ps
ps
ps
ps
ps
ps
%
ms
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the
device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after
thermal equilibrium has been reached under these conditions.
NOTE 1: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 2: Please refer to the Phase Noise plots.
NOTE 3: Peak-to-Peak jitter after applying system transfer function for the Common Clock Architecture. Maximum limit for PCI Express
Gen 1 is 86ps peak-to-peak for a sample size of 10⁶ clock periods.
NOTE 4: RMS jitter after applying the two evaluation bands to the two transfer functions defined in the Common Clock Architecture and
reporting the worst case results for each evaluation band. Maximum limit for PCI Express Generation 2 is 3.1ps RMS for t_{REFCLK_HF_RMS}
(High Band) and 3.0ps RMS for t_{REFCLK_LF_RMS} (Low Band).
NOTE 5: This parameter is guaranteed using a 25MHz crystal.
©2017 Integrated Device Technology, Inc.
6
April 13, 2017