83940D Datasheet, PDF (6/16 Pages) Integrated Device Technology – Maximum output frequency

83940D DATA SHEET
TABLE 4C. DC CHARACTERISTICS, V_DD = V_DDO = 2.5V±5%, TA = 0° TO 70°
Symbol Parameter
Test Conditions Minimum Typical
V_IH
Input High Voltage
LVCMOS_CLK
2
V_IL
Input Low Voltage
LVCMOS_CLK
V_PP
Peak-to-Peak
Input Voltage
PCLK, nPCLK
300
V_CMR
Input Common Mode Voltage;
NOTE 1, 2
PCLK, nPCLK
V_DD - 1.4
I_IN
Input Current
V_OH
Output High Voltage
I_OH = -12mA
1.8
V_OL
Output Low Voltage
I_OL = 12mA
I_DD
Core Supply Current
NOTE 1: For single ended applications, the maximum input voltage for PCLK, nPCLK is V_DD + 0.3V.
NOTE 2: Common mode voltage is defined as V_IH.
Maximum
V_DD
0.8
1000
V_DD - 0.6
±200
0.5
25
Units
V
V
mV
V
µA
V
V
mA
TABLE 5C. AC CHARACTERISTICS, V_DD = V_DDO = 2.5V±5%, TA = 0° TO 70°
Symbol Parameter
Test Conditions
Minimum Typical Maximum Units
f_MAX
Output Frequency
PCLK, nPCLK;
NOTE 1, 5
f ≤ 150MHz
1.2
t_pLH
Propagation Delay;
LVCMOS_CLK;
NOTE 2, 5
f ≤ 150MHz
1.5
PCLK, nPCLK;
NOTE 1, 5
f > 150MHz
1.5
t_pLH
Propagation Delay;
LVCMOS_CLK;
NOTE 2, 5
f > 150MHz
2
200
MHz
3.8
ns
3.2
ns
3.7
ns
3.6
ns
tsk(o)
tsk(pp)
Output Skew;
NOTE 3, 5
Part-to-Part Skew;
NOTE 6
PCLK, nPCLK
LVCMOS_CLK
PCLK, nPCLK
LVCMOS_CLK
Measured on
rising edge @V_DDO/2
f ≤ 150MHz
f ≤ 150MHz
200
ps
200
ps
2.6
ns
1.7
ns
tsk(pp)
Part-to-Part Skew;
NOTE 6
PCLK, nPCLK
LVCMOS_CLK
f > 150MHz
f > 150MHz
2.2
ns
1.7
ns
tsk(pp)
tjit
Part-to-Part Skew; ^{PCLK, nPCLK}
NOTE 4, 5
LVCMOS_CLK
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter section,
NOTE 7
Measured on
rising edge @V_DDO/2
1.2
ns
1.0
ns
0.03
ps
t_R / t_F
odc
Output Rise/Fall Time
Output Duty Cycle
0.5 to 1.8V
0.3
f < 134MHz
45
1.2
ns
55
%
All parameters measured at 200MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output V /2.
DDO
NOTE 2: Measured from V_DD/2 to V_DDO/2.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V_DDO/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltages, same temperature,
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at V_DDO/2.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges,
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at V_DDO/2.
NOTE 7 Driving only one input clock.
LOW SKEW, 1-TO-18
6
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
REVISION B 3/25/15