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ICS854S054I Datasheet, PDF (4/14 Pages) Integrated Device Technology – One differential LVDS output pair
ICS854S054I Data Sheet
4:1, DIFFERENTIAL-TO-LVDS CLOCK MULTIPLEXER
Table 4D. LVDS DC Characteristics, VDD = 3.3V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
VOD
∆VOD
VOS
∆VOS
Differential Output Voltage
VOD Magnitude Change
Offset Voltage
VOS Magnitude Change
247
1.125
Typical
380
1.28
Maximum
454
50
1.375
50
Units
mV
mV
V
mV
AC Electrical Characteristics
Table 5. AC Characteristics, VDD = 3.3V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
Test Conditions
fOUT
tPD
tjit(Ø)
Output Frequency
Propagation Delay; NOTE 1
Buffer Additive Phase Jitter,
RMS; Refer to Additive Phase
Jitter Section
155.52MHz, Integration Range:
12kHz – 20MHz
tsk(pp)
Part-to-Part Skew; NOTE 2, 3
tsk(i)
Input Skew
tR / tF
MUXISOLATION
Output Rise/Fall Time
MUX Isolation; NOTE 4
20% to 80%
155.52MHz, VPP = 800mV
Minimum
295
70
Typical
470
0.147
10
150
86
Maximum
2.5
700
Units
GHz
ps
ps
300
ps
50
ps
250
ps
dB
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
All parameters measured ≤ 1.0GHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature, same frequency and
with equal load conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: Q, nQ output measured differentially. See Parameter Measurement Information for MUX Isolation diagram.
ICS854S054AGI REVISION A SEPTEMBER 28, 2012
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©2012 Integrated Device Technology, Inc.