840N022 Datasheet, PDF (4/13 Pages) Integrated Device Technology – FemtoClock® NG Crystal-to-LVCMOS/LVTTL Clock

840N022 DATA SHEET
Table 4. Crystal Characteristics
Parameter
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
Capacitive Load (C_L)
Test Conditions
Minimum
19.60
Typical
Fundamental
25
12
Maximum
25.50
80
7
Units
MHz

pF
pF
AC Characteristics
Table 5. AC Characteristics, V_DD = 3.3V±5% or 2.5V±5%, T_A = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
f_OUT
Output Frequency
FREQ_SEL = 0
FREQ_SEL = 1
98.00
49.00
tjit(Ø)
RMS Phase Jitter (Random);
NOTE 1
f_OUT = 125MHz, 25MHz Crystal,
Integration Range:
1.875MHz – 20MHz
f_OUT = 125MHz, 25MHz Crystal,
Integration Range:
12kHz – 20MHz
125MHz, Offset: 10Hz
125MHz, Offset: 100Hz
125MHz, Offset: 1kHz
_N
Single-Side Band Noise Power
125MHz, Offset: 10kHz
125MHz, Offset: 100kHz
125MHz, Offset: 1MHz
125MHz, Offset: 10MHz
t_R / t_F
odc
Output Rise/Fall Time
Output Duty Cycle
20% to 80%
200
48
Typical
125
62.5
0.104
0.286
-51.7
-83.6
-115.9
-130.2
-134.7
-141.8
-158.3
Maximum
127.50
63.75
Units
MHz
MHz
0.148
ps
0.479
600
52
ps
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
ps
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions.
NOTE: Characterized with 20MHz and 25MHz crystals.
NOTE 1: Please refer to the phase noise plots.
FEMTOCLOCK® NG CRYSTAL-TO-LVCMOS/LVTTL CLOCK
4
SYNTHESIZER
REVISION A 8/14/15