840N021 Datasheet, PDF(4/13 Page) Integrated Device Technology – FemtoClock NG Crystal-to-LVCMOS/LVTTL Clock

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840N021 Datasheet, PDF (4/13 Pages) Integrated Device Technology – FemtoClock NG Crystal-to-LVCMOS/LVTTL Clock

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Table 4. Crystal Characteristics

Parameter

Mode of Oscillation

Frequency

Equivalent Series Resistance (ESR)

Shunt Capacitance

Capacitive Load (CL)

Test Conditions

840N021 DATA SHEET

Minimum

19.6

Typical

Fundamental

Maximum

25.5

Units

MHz

AC Characteristics

Table 5. AC Characteristics, VDD = 3.3VÂ±5% or 2.5VÂ±5%, TA = -40Â°C to 85Â°C

Symbol Parameter

Test Conditions

Minimum

fOUT

Output Frequency

tjit(Ã)

RMS Phase Jitter (Random);

NOTE 1

fOUT = 125MHz, Integration Range:

1.875MHz â 20MHz, 25MHz crystal

fOUT = 100MHz, Integration Range:

12kHz â 20MHz, 20MHz crystal

fOUT = 125MHz, Offset: 10Hz

fOUT = 125MHz, Offset: 100Hz

fOUT = 125MHz, Offset: 1kHz

ïN

Single-Side Band Noise Power

fOUT = 125MHz, Offset: 10kHz

fOUT = 125MHz, Offset: 100kHz

fOUT = 125MHz, Offset: 1MHz

fOUT = 125MHz, Offset: 10MHz

tR / tF

Output Rise/Fall Time

20% to 80%

200

odc

Output Duty Cycle

Typical

125

0.111

0.348

-53.9

-83.8

-111.4

-128.4

-131.9

-141.3

-157.6

Maximum

127.5

0.156

0.451

600

Units

MHz

dBc/Hz

NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device

is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal

equilibrium has been reached under these conditions.

NOTE: Characterized with 20MHz and 25MHz crystals.

NOTE 1: Please refer to the phase noise plots.

REVISION A 8/14/15

FEMTOCLOCKÂ® NG CRYSTAL-TO-LVCMOS/LVTTL CLOCK

SYNTHESIZER

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