71256SA20TPG Datasheet, PDF (3/8 Pages) Integrated Device Technology – CMOS Static RAM 256K (32K x 8-Bit)

IDT71256SA
CMOS Static RAM 256K (32K x 8-Bit)
Commercial and Industrial Temperature Ranges
DC Electrical Characteristics
(VCC = 5.0V ± 10%)
IDT71256SA
Symbol
Parameter
Test Conditions
Min.
Max.
Unit
|ILI|
Input Leakage Current
|ILO|
Output Leakage Current
VOL
Output Low Voltage
VOH
Output High Voltage
VCC = Max., VIN = GND to VCC
VCC = Max., CS = VIH, VOUT = GND to VCC
IOL = 8mA, VCC = Min.
IOH = -4mA, VCC = Min.
___
5
µA
___
5
µA
___
0.4
V
2.4
___
V
2948 tbl 05
DC Electrical Characteristics⁽¹⁾
(VCC = 5.0V ± 10%, VLC = 0.2V, VHC = VCC–0.2V)
Symbol
Parameter
71256SA12
ICC Dynamic Operating Current
160
CS < VIL, Outputs Open, VCC = Max., f = fMAX⁽²⁾
ISB Standby Power Supply Current (TTL Level)
50
CS > VIH, Outputs Open, VCC = Max., f = fMAX⁽²⁾
ISB1 Standby Power Supply Current (CMOS Level)
15
CS > VHC, Outputs Open, VCC = Max., f = 0⁽²⁾,
VIN < VLC or VIN > VHC
71256SA15
150
40
15
NOTES:
1. All values are maximum guaranteed values.
2. fMAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address input lines are changing.
71256SA20
145
40
15
71256SA25
Unit
145
mA
40
mA
15
mA
2948 tbl 06
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
GND to 3.0V
3ns
1.5V
1.5V
See Figures 1 and 2
2948 tbl 07
Capacitance
(TA = +25°C, f = 1.0MHz, SOJ package)
Symbol
Parameter⁽¹⁾
Conditions Max. Unit
CIN
Input Capacitance
VIN = 3dV
7
pF
CI/O
I/O Capacitance
VOUT = 3dV
7
pF
NOTE:
2948 tbl 08
1. This parameter is guaranteed by device characterization, but not production
tested.
5V
5V
DATA OUT
480Ω
DATA OUT
480Ω
30pF*
255Ω
,
2948 drw 03
5pF*
255Ω
.
2948 drw 04
Figure 1. AC Test Load
*Including jig and scope capacitance.
Figure 2. AC Test Load
(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)
6.432