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ICS932S825 Datasheet, PDF (8/20 Pages) Integrated Circuit Systems – Low Power Clock Chip for Serverworks HT2400 Servers
ICS932S825
AC Electrical Characteristics - Low Power Differential PCIe Outputs
TA = 0 - 70°C; VDD = 3.3 V +/-5%; CL =2pF, RS=33.2Ω
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX UNITS NOTES
Rising Edge Slew Rate
tSLR
Differential Measurement
0.5
2
V/ns 1,2
Falling Edge Slew Rate
Slew Rate Variation
Maximum Output
Voltage
tFLR
tSLVAR
VHIGH
Differential Measurement
0.5
Single-ended Measurement
Includes overshoot
2
V/ns 1,2
20
%
1
1150 mV
1
Minimum Output Voltage VLOW
Includes undershoot
-300
mV
1
Differential Voltage
Swing
VSWING
Differential Measurement
400
mV
Crossing Point Voltage
VXABS
Single-ended Measurement
300
550
mV
Crossing Point Variation VXABSVAR
Single-ended Measurement
140
mV
Duty Cycle
DCYC
Differential Measurement
45
PCIe Jitter - Cycle to
Cycle
PCIeJC2C
Differential Measurement
55
%
125
ps
PCIe[6:0] Skew
PCIeSKEW
Notes on Electrical Characteristics:
Differential Measurement
250
ps
1Guaranteed by design and characterization, not 100% tested in production.
2 Slew rate measured through Vswing centered around differential zero
3 Vxabs is defined as the voltage where CLK = CLK#
4 Only applies to the differential rising edge (CLK rising and CLK# falling)
5 Defined as the total variation of all crossing voltages of CLK rising and CLK# falling.
6 All Long Term Accuracy and Clock Period specifications are guaranteed assuming that REFOUT is at 14.31818MHz
1
1,3,4
1,3,5
1
1
1
PCIe Phase Jitter Impact
Parameter
Conditions
Min Typical Max Units Notes
Output phase jitter
impact – PCIe* Gen1
θPCIe1
(including PLL BW 1.5-22 MHz, z =
0.54, Td=10 ns, Ftrk=1.5 MHz )
0
108
ps 1,2,3,4
Output phase jitter
impact - PCIe Gen2
θPCIe2
(including PLL BW5-16 MHz,
8 – 16 MHz, z = 0.54, Td=10 ns)
0
ps
3.1
RMS 1,2,3,4
NOTES:
1. Post processed evaluation through Intel supplied Matlab scripts.
2. PCIe* Gen2 filter characteristics are subject to f inal ratification by PC ISIG. Please check the PCI* SIG f or the latest specif ication.
3. These jitter numbers are def ined f or a BER of 1E-12. Measured numbers at a smaller sample size have to be extrapolated to this BER target.
4. Guaranteed by design and characterization, not 100% tested in production.
1276D—10/25/07
8