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MRF7S21170HR3_12 Datasheet, PDF (3/17 Pages) Freescale Semiconductor, Inc – RF Power Field Effect Transistors
Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) (continued)
Characteristic
Symbol
Min
Typ
Max
Unit
Typical Performances (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1400 mA, 2110--2170 MHz Bandwidth
Video Bandwidth @ 170 W PEP Pout where IM3 = --30 dBc
(Tone Spacing from 100 kHz to VBW)
VBW
—
25
—
IMD3 = IMD3 @ VBW frequency -- IMD3 @ 100 kHz <1 dBc (both
sidebands)
MHz
Gain Flatness in 60 MHz Bandwidth @ Pout = 50 W Avg.
Average Deviation from Linear Phase in 60 MHz Bandwidth
@ Pout = 170 W CW
Average Group Delay @ Pout = 170 W CW, f = 2140 MHz
Part--to--Part Insertion Phase Variation @ Pout = 170 W CW
f = 2140 MHz, Six Sigma Window
GF
—
0.4
—
dB

—
1.95
—

Delay
—
1.7
—
ns

—
18
—

Gain Variation over Temperature
(--30C to +85C)
G
—
0.015
—
dB/C
Output Power Variation over Temperature
(--30C to +85C)
P1dB
—
0.01
—
dB/C
1. VGG = 2 x VGS(Q). Parameter measured on Freescale Test Fixture, due to resistive divider network on the board. Refer to Test Circuit
schematic.
2. Part internally matched both on input and output.
RF Device Data
Freescale Semiconductor, Inc.
MRF7S21170HR3 MRF7S21170HSR3
3