MC9S08QB8 Datasheet, PDF (23/36 Pages) Freescale Semiconductor, Inc – 8-Bit HCS08 Central Processor Unit

Electrical Characteristics
Table 16. 12-Bit ADC Characteristics (V_REFH = V_DDA, V_REFL = V_SSA) (continued)
Characteristic
Conditions
C Symbol Min Typical¹ Max
Unit
Comment
Integral
Non-Linearity
Zero-Scale
Error
12-bit mode
10-bit mode
8-bit mode
12-bit mode
10-bit mode
8-bit mode
T
—
±1.5
—
INL
—
±0.5
—
LSB²
C
—
±0.3
—
C
—
±1.5
—
For 28-pin and
P
E_ZS
—
±0.5
±1.5
LSB²
24-pin
packages only.
T
—
±0.5
±0.5
V_ADIN = V_SSA
Zero-Scale
Error
Full-Scale
Error
10-bit mode
8-bit mode
12-bit mode
10-bit mode
8-bit mode
P
—
±1.5
±2.1
For 16-pin
E_ZS
LSB² package only.
T
—
±0.5
±0.7
V_ADIN = V_SSA
T
—
±1
—
For 28-pin and
P
E_FS
—
±0.5
±1
LSB²
24-pin
packages only.
T
—
±0.5
±0.5
V_ADIN = V_DDA
Full-Scale
Error
Quantization
Error
Input Leakage
Error
Temp Sensor
Slope
10-bit mode
8-bit mode
12-bit mode
10-bit mode
8-bit mode
12-bit mode
10-bit mode
8-bit mode
−40°C– 25°C
25°C– 85°C
T
E_FS
T
D
E_Q
D
E_IL
D
m
—
±1
±1.5
For 16-pin
LSB² package only.
—
±0.5
±0.5
V_ADIN = V_DDA
—
–1 to 0
—
—
—
±0.5 LSB²
—
—
±0.5
—
±1
—
0
±0.2
±4
LSB²
Pad leakage³ *
R_AS
0
±0.1
±1.2
—
1.646
—
mV/°C
—
1.769
—
Temp Sensor
Voltage
25°C
D V_TEMP25
—
701.2
—
mV
1 _{Typical values assume VDDA = 3.0 V, Temp = 25 °C, fADCK=1.0 MHz unless otherwise stated. Typical values are for reference}
only and are not tested in production.
2 _{1 LSB = (VREFH – VREFL)/2}N
3 _{Based on input pad leakage current. Refer to pad electricals.}
3.13 Flash Specifications
This section provides details about program/erase times and program-erase endurance for the flash
memory.
MC9S08QB8 Series MCU Data Sheet, Rev. 3
Freescale Semiconductor
23