MC9S08QE32 Datasheet, PDF (19/44 Pages) Freescale Semiconductor, Inc – 8-Bit HCS08 Central Processor Unit (CPU)

Electrical Characteristics
Table 10. ICS Frequency Specifications (Temperature Range = –40 to 85°C Ambient) (continued)
Num C
Characteristic
Symbol Min Typical¹ Max Unit
8
C
Total deviation of trimmed DCO output frequency over voltage
and temperature
Δf_{dco_t}
9
C
Total deviation of trimmed DCO output frequency over fixed
voltage and temperature range of 0°C to 70 °C
Δf_{dco_t}
—
+ 0.5
–1.0
±2 %f_dco
—
± 0.5
±1 %f_dco
10 C _{FLL acquisition time} ³
t_Acquire
—
—
1
ms
Long term jitter of DCO output clock (averaged over 2-ms
11 C _{interval) 4}
C_Jitter
—
0.02
0.2 %f_dco
1 _{Data in Typical column is characterized at 3.0 V, 25°C or is typical recommended value.}
2 _{The resulting bus clock frequency should not exceed the maximum specified bus clock frequency of the device.}
3 _{This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or}
changing from FLL disabled (FBELP, FBILP) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as
the reference, this specification assumes it is already running.
4 _{Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum fBus.}
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V_DD and V_SS and variation in crystal oscillator frequency increase the C_Jitter percentage
for a given interval.
3.10 AC Characteristics
This section describes timing characteristics for each peripheral system.
0.40%
0.20%
0.00%
–0.20%
DEVIATION
–0.40%
–0.60%
–0.80%
–60 –40 –20
0
20
40
60
TEMPERATURE
80
100 120 140
MC9S08QE32 MCU Series Data Sheet, Rev. 1
Freescale Semiconductor
19