MC9S12DT128 Datasheet, PDF (113/142 Pages) Freescale Semiconductor, Inc – Device User Guide

Device User Guide — 9S12DT128DGV2/D V02.15
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
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