MC20XS4200 Datasheet, PDF (10/60 Pages) Freescale Semiconductor, Inc – Dual 24 V, 20 mOhm High Side Switch

ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics (continued)
Unless specified otherwise: 8.0 V ≤ V_PWR ≤ 36 V, 3.0 V ≤ V_DD ≤ 5.5 V, - 40 °C ≤ T_A ≤ 125 °C, GND = 0 V. Typical values are
average values evaluated under nominal conditions T_A = 25 °C, V_PWR = 28 V & V_DD = 5.0 V, unless specified otherwise.
Parameter
Symbol
Min
Typ
Max
Unit
ELECTRICAL CHARACTERISTICS OF THE OUTPUT STAGE (HS0 AND HS1) (CONTINUED)
Over-current Detection thresholds with CSNS_ratio bit = 1(CSR1)
I_{_OCH1_1}
I_{_OCH2_1}
I_{_OCM1_1}
I_{_OCM2_1}
I_{_OCL1_1}
I_{_OCL2_1}
I_{_OCL3_1}
9.2
11.0
12.8
A
5.8
7.0
8.2
3.6
4.3
5.1
2.2
2.7
3.1
1.5
1.8
2.1
1.0
1.2
1.4
0.48
0.6
0.72
Output (HS[x]) leakage Current in sleep state (positive value = outgoing) I_{OUT_LEAK}
V_HS,OFF = 0 V (V_HS,OFF = output voltage in OFF state)
–
–
V_HS,OFF = V_PWR, device in sleep state (V_PWR = 24 V max.)
-40.0
–
µA
+5.0
+5.0
Switch Turn-on threshold for Supply over-voltage (V_PWR -GND)
V_{D_GND(CLAMP)}
58
–
66
V
Switch turn-on threshold for Drain-Source over-voltage (measured at
V_DS(CLAMP)
58
–
I_OUT = 500 mA
66
V
Switch turn-on threshold for Drain-Source over-voltage difference from
ΔV_DS(CLAMP)
one channel to the other in parallel mode (@ I_HS = 500 mA)
-2.0
–
+2.0
V
Current Sensing Ratio⁽¹³⁾
CSNS_ratio bit = 0 (high current mode)
CSNS_ratio bit = 1 (low current mode)
Minimum measurable load current with compensated error⁽¹⁴⁾
C_SR0
C_SR1
I_{_LOAD_MIN}
–
–
1/1500
–
–
1/500
–
–
–
50
mA
CSNS leakage current in OFF state (CSNSx_en = 0, CSNS_ratio bit_x = 0)
I_{CSR_LEAK}
-4.0
–
+4.0
µA
Systematic offset error (see Current Sense Errors)
I_{_LOAD_ERR_SYS}
–
5.5
–
mA
Random offset error
I_{_LOAD_ERR_RAND}
-125
–
125
mA
Notes:
13. Current Sense Ratio C_SRx = I_CSNS / (I_HS[x] +I_{_LOAD_ERR_SYS})
14. See note ⁽¹⁵⁾, but with I_{CSNS_MEAS} obtained after compensation of I_{_LOAD_ERR_RAND} (see Activation and Use of Offset Compensation).
Further accuracy improvements can be obtained by performing a 1- or 2 point calibration (see Application Note)
15. E_{SRx_ERR}=(I_{CSNS_MEAS} / I_{CSNS_MODEL}) -1, with I_{CSNS_MODEL} = (I(HS[x])+ I_{_LOAD_ERR_SYS}) * C_{SRx ,} (I_{_LOAD_ERR_SYS} defined above, see
section Current Sense Error Model). With this model, load current becomes: I(HS[x]) ₌ I_CSNS / CSR_x - I_{_LOAD_ERR_SYS}
20XS4200
10
Analog Integrated Circuit Device Data
Freescale Semiconductor