FMBTA05 Datasheet, PDF (9/9 Pages) Formosa MS – Drive NPN Transistor

Drive NPN Transistor
FMBTA05 / FMBTA06
High reliability test capabilities
Item Test
Conditions
1. Steady State Operating Life
TA=25°C P_D=225mW Test Duration:1000hrs
Formosa MS
2. High Temperature Reverse Bias
3. Temperature Cycle
4. Autoclave
Tj= 150℃, V = _CE 80% related volage,Test Duration:1000hrs
-55℃( 15min) to 150℃( 15min)Air to Air Transition Time< 20sec Test Cycles:1000cycle
P=2atm Ta=121℃ RH=100% Test Duration:96hrs
5. High Temperature Storage Life
Ta=150℃ Test Duration:1000hrs
6. Solderability
245℃,Test Duration:5sec
7. High Temperature High Humidity Reverse
Bias
Ta= 85℃, 85% RH, V = _CE 80% related volage, Test Duration: 1000hrs
8. Resistance to Soldering Heat
260℃,Test Duration:10sec
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Page 9
Document ID Issued Date
DS-231111 2008/02/10
Revised Date Revision
2011/07/21
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