FMBT3946DW Datasheet, PDF (14/14 Pages) Formosa MS – Dual NPN +PNP SMD Transistor

Dual NPN +PNP SMD Transistor
FMBT3946DW
High reliability test capabilities
Item Test
Conditions
1. Steady State Operating Life
TA=25°C P_D=150mW Test Duration:1000hrs
Formosa MS
2. High Temperature Reverse Bias
3. Temperature Cycle
4. Autoclave
Tj= 150℃, V = _CE 80% related volage, Test Duration:1000hrs
-55℃(15min) to 150℃( 15min) Air to Air Transition Time< 20sec Test Cycles: 1000cycle
P=2atm Ta= 121℃ RH= 100% Test Duration: 96hrs
5. High Temperature Storage Life
Ta=150℃ Test Duration: 1000hrs
6. Solderability
245℃,Test Duration:5sec
7. High Temperature High Humidity Reverse
Bias
Ta= 85℃, 85% RH, V = _CE 80% related volage, Test Duration: 1000hrs
8. Resistance to Soldering Heat
260℃,Test Duration:10sec
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Page 14
Document ID
DS-231156
Issued Date
2010/01/10
Revised Date
2010/06/10
Revision
B
Page.
14