FAN3226_11 Datasheet, PDF (6/25 Pages) Fairchild Semiconductor – Dual 2A High-Speed, Low-Side Gate Drivers

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
V_DD
V_EN
V_IN
V_OUT
T_L
T_J
T_STG
ESD
VDD to PGND
ENA and ENB to GND
INA, INA+, INA–, INB, INB+ and INB– to GND
OUTA and OUTB to GND
Lead Soldering Temperature (10 Seconds)
Junction Temperature
Storage Temperature
Electrostatic Discharge
Protection Level
Human Body Model, JEDEC JESD22-A114
Charged Device Model, JEDEC JESD22-C101
Min.
Max. Unit
-0.3
20.0
V
GND - 0.3 V_DD + 0.3 V
GND - 0.3 V_DD + 0.3 V
GND - 0.3 V_DD + 0.3 V
+260
ºC
-55
+150
ºC
-65
+150
ºC
4
kV
1
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
V_DD Supply Voltage Range
V_EN Enable Voltage ENA and ENB
V_IN Input Voltage INA, INA+, INA–, INB, INB+ and INB–
T_A
Operating Ambient Temperature
Min.
4.5
0
0
-40
Max.
18.0
V_DD
V_DD
+125
Unit
V
V
V
ºC
© 2007 Fairchild Semiconductor Corporation
FAN3226 / FAN3227 / FAN3228 / FAN3229 • Rev. 1.0.7
6
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