FAN3223_12 Datasheet, PDF (6/24 Pages) Fairchild Semiconductor – Dual 4A High-Speed, Low-Side Gate Drivers

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
VDD VDD to PGND
V_EN
V_IN
VOUT
TL
ENA and ENB to GND
INA, INA+, INA–, INB, INB+ and INB– to GND
OUTA and OUTB to GND
Lead Soldering Temperature (10 Seconds)
T_J Junction Temperature
T_STG Storage Temperature
ESD Human Body Model, JEDEC JESD22-A114
Min.
Max. Unit
-0.3
20.0
V
GND - 0.3 V_DD + 0.3 V
GND - 0.3 V_DD + 0.3 V
GND - 0.3 VDD + 0.3 V
+260 ºC
-55
+150 ºC
-65
+150 ºC
3
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
V_DD Supply Voltage Range
VEN Enable Voltage ENA and ENB
VIN Input Voltage INA, INA+, INA–, INB, INB+ and INB–
T_A Operating Ambient Temperature
Min.
4.5
0
0
-40
Max.
18.0
VDD
VDD
+125
Unit
V
V
V
ºC
© 2012 Fairchild Semiconductor Corporation
FAN3223 / FAN3224 / FAN3225_F085 • Rev. 1.0.0
6
www.fairchildsemi.com