FQPF22P10 Datasheet, PDF (5/8 Pages) Fairchild Semiconductor – 100V P-Channel MOSFET

Gate Charge Test Circuit & Waveform
Same Type
V_GS
50KΩ
as DUT
Q_g
12V
200nF
300nF
-10V
V_GS
V_DS
Q_gs
Q_gd
DUT
-3mA
Charge
Resistive Switching Test Circuit & Waveforms
-10V
V_DS
V_GS
R_G
R_L
V_DD
DUT
t_d(on)
V_{GS 10%}
t _on
t_r
V_DS
90%
t _off
t_d(off)
t_f
Unclamped Inductive Switching Test Circuit & Waveforms
L
V_DS
E_AS
=
--1--
2
L I_AS2
BV_DSS
--------------------
BV_DSS - V_DD
t_p
Time
I_D
R_G
V_DD
V_DD
I_D (t)
V_DS (t)
-10V
t_p
DUT
I_AS
BV_DSS
©2002 Fairchild Semiconductor Corporation
Rev. B, August 2002