FOD260L Datasheet, PDF (4/19 Pages) Fairchild Semiconductor – LVTTL/LVCMOS 3.3V High Speed-10 MBit/s Logic Gate Optocouplers

Transfer Characteristics (T_A = -40°C to +85°C Unless otherwise specified. Typical value is measured at
T_A = 25°C and V_CC = 3.3V)
Symbol DC Characteristics
Test Conditions
Min. Typ. Max. Unit
I_OH High Level Output Current I_F = 250 µA, V_CC = 3.3 V, V_O = 3.3 V,
V_E = 2.0 V (Note 2)
V_OL Low Level Output Voltage V_CC = 3.3 V, I_F = 5 mA, I_OL = 13 mA,
V_E = 2.0 V (Note 2)
I_FT Input Threshold Current V_CC = 3.3 V, V_O = 0.6 V, I_OL = 13 mA,
V_E = 2.0 V (Note 2)
0.01
50
µA
0.3
0.6
V
1
5
mA
Isolation Characteristics (T_A = -40°C to +85°C Unless otherwise specified. Typical value is measured at
T_A = 25°C and V_CC = 3.3V)
Symbol
Characteristics
Test Conditions Min. Typ. Max. Unit
I_I-O Input-Output
Insulation Leakage Current
V_ISO Withstand Insulation Test
Voltage
Relative humidity = 45%,
T_A = 25°C, t = 5 s,
V_I-O = 3000 VDC (Note 12)
I_IO ≤ 2 µA, R_H < 50%,
T_A = 25°C, t = 1 min.(Note 12)
1.0
µA
V_RMS
FOD060L
3750
FOD260L
5000
R_I-O Resistance (Input to Output) V_I-O = 500 V (Note 12)
C_I-O Capacitance (Input to Output) f = 1 MHz (Note 12)
10¹²
Ω
0.6
pF
Notes
1. The V_CC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic
or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible
to the package V_CC and GND pins of each device.
2. Enable Input – No pull up resistor required as the device has an internal pull up resistor.
3. t_PLH – Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current
pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
4. t_PHL – Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current
pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
5. t_PSK is the worst case difference between t_PHL and t_PLH for any devices at the stated test conditions.
6. t_r – Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
7. t_f – Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
8. t_ELH – Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input
voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
9. t_EHL – Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input
voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
10. CM_H – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high
state (i.e., V_OUT > 2.0 V). Measured in volts per microsecond (V/µs).
11. CM_L – The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low
output state (i.e., V_OUT < 0.8 V). Measured in volts per microsecond (V/µs).
12. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted
together.
©2008 Fairchild Semiconductor Corporation
FOD060L, FOD260L Rev. 1.0.5
4
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