FAN3111 Datasheet, PDF (4/18 Pages) Fairchild Semiconductor – Single 1A High-Speed, Low-Side Gate Driver

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device
reliability. The absolute maximum ratings are stress ratings only.
Symbol
Parameter
VDD VDD to GND
VIN Voltage on IN to GND
FAN3111C
FAN3111E
VXREF
VOUT
Voltage on XREF to GND
Voltage on OUT to GND
FAN3111E
TL
TJ
TSTG
ESD
Lead Soldering Temperature (10 Seconds)
Junction Temperature
Storage Temperature
Human Body Model, JESD22-A114
Charged Device Model, JESD22-C101
Min. Max. Unit
-0.3 20.0
V
-0.3 VDD + 0.3 V
-0.3 VXREF+0.3 V
-0.3
5.5
V
-0.3 VDD+0.3 V
+260 ºC
+150 ºC
-65 +150 ºC
4
kV
750
V
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
VDD ^{Supply Voltage Range}
Parameter
VIN Input Voltage IN
VXREF
TA
External Reference Voltage XREF
Operating Ambient Temperature
FAN3111C
FAN3111E
FAN3111E
Min.
4.5
0
0
2.0
-40
Max.
18.0
VDD
VXREF
5.0
+125
Unit
V
V
V
V
ºC
© 2008 Fairchild Semiconductor Corporation
FAN3111 • Rev. 1.0.1
4
www.fairchildsemi.com