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FQP10N20C Datasheet, PDF (2/10 Pages) Fairchild Semiconductor – 200V N-Channel MOSFET
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Electrical Characteristics
Symbol
Parameter
TC = 25°C unless otherwise noted
Test Conditions
Min Typ Max Units
Off Characteristics
BVDSS
∆BVDSS
/ ∆TJ
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
VGS = 0 V, ID = 250 µA
200 --
ID = 250 µA, Referenced to 25°C -- 0.28
IDSS
Zero Gate Voltage Drain Current
VDS = 200 V, VGS = 0 V
VDS = 160 V, TC = 125°C
--
--
--
--
IGSSF
IGSSR
Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V
Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0 V
--
--
--
--
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
Static Drain-Source
On-Resistance
gFS
Forward Transconductance
VDS = VGS, ID = 250 µA
2.0
VGS = 10 V, ID = 4.75 A
--
VDS = 40 V, ID = 4.75 A (Note 4) --
--
0.29
5.5
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
-- 395
-- 97
-- 40.5
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = 100 V, ID = 9.5 A,
--
RG = 25 Ω
--
--
(Note 4, 5)
--
VDS = 160 V, ID = 9.5 A,
--
VGS = 10 V
--
(Note 4, 5) --
11
92
70
72
20
3.1
10.5
--
--
10
100
100
-100
4.0
0.36
--
510
125
53
30
190
150
160
26
--
--
V
V/°C
µA
µA
nA
nA
V
Ω
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
9.5
A
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
38
A
VSD
Drain-Source Diode Forward Voltage VGS = 0 V, IS = 9.5 A
--
--
1.5
V
trr
Reverse Recovery Time
VGS = 0 V, IS = 9.5 A,
-- 158
--
ns
Qrr
Reverse Recovery Charge
dIF / dt = 100 A/µs
(Note 4) -- 0.97
--
µC
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 3.5mH, IAS = 9.5A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C
3. ISD ≤ 9.5A, di/dt ≤ 300A/µs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Pulse Test : Pulse width ≤ 300µs, Duty cycle ≤ 2%
5. Essentially independent of operating temperature
©2003 Fairchild Semiconductor Corporation
Rev. A, March 2003
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