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FQU8P10TU Datasheet, PDF (1/9 Pages) Fairchild Semiconductor – P-Channel QFET® MOSFET -100 V, -6.6 A, 530 mΩ
FQD8P10 / FQU8P10
P-Channel QFET® MOSFET
-100 V, -6.6 A, 530 mΩ
November 2013
Description
This P-Channel enhancement mode power MOSFET is
produced using Fairchild Semiconductor’s proprietary
planar stripe and DMOS technology. This advanced
MOSFET technology has been especially tailored to
reduce on-state resistance, and to provide superior
switching performance and high avalanche energy
strength. These devices are suitable for switched mode
power supplies, audio amplifier, DC motor control, and
variable switching power applications.
Features
• -6.6 A, -100 V, RDS(on) = 530 mΩ (Max) @ VGS = -10 V,
ID = -3.3 A
• Low Gate Charge (Typ. 12 nC)
• Low Crss (Typ. 30 pF)
• 100% Avalanche Tested
S
G
S
D
D-PAK
GDS
G
I-PAK
D
Absolute Maximum Ratings TC = 25oC unless otherwise noted.
Symbol
VDSS
ID
IDM
VGSS
EAS
IAR
EAR
dv/dt
PD
TJ, TSTG
TL
Parameter
Drain-Source Voltage
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
Drain Current - Pulsed
(Note 1)
Gate-Source Voltage
Single Pulsed Avalanche Energy
(Note 2)
Avalanche Current
(Note 1)
Repetitive Avalanche Energy
(Note 1)
Peak Diode Recovery dv/dt
(Note 3)
Power Dissipation (TA = 25°C) *
Power Dissipation (TC = 25°C)
- Derate above 25°C
Operating and Storage Temperature Range
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
FQD8P10TM / FQU8P10TU
-100
-6.6
-4.2
-26.4
 30
150
-6.6
4.4
-6.0
2.5
44
0.35
-55 to +150
300
Unit
V
A
A
A
V
mJ
A
mJ
V/ns
W
W
W/°C
°C
°C
Thermal Characteristics
Symbol
Parameter
RJC
RJA
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient (Minimum Pad of 2-oz Copper), Max.
Thermal Resistance, Junction to Ambient (*1 in2 Pad of 2-oz Copper), Max.
FQD8P10TM
FQU8P10TU
2.84
110
50
Unit
oC/W
©2010 Fairchild Semiconductor Corporation
1
FQD8P10 / FQU8P10 Rev. C2
www.fairchildsemi.com