5962-8853801VGA Datasheet, PDF(6/14 Page) List of Unclassifed Manufacturers – MICROCIRCUIT, LINEAR, DUAL PRECISION JFET-INPUT OPERATIONAL AMPLIFIERS MONOLITHIC SILICON

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5962-8853801VGA Datasheet, PDF (6/14 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, LINEAR, DUAL PRECISION JFET-INPUT OPERATIONAL AMPLIFIERS MONOLITHIC SILICON

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TABLE I. Electrical performance characteristics â Continued.

Test

Slew rate 4/

Settling time 4/ 5/

Common-mode 4/

rejection ratio

Power supply rejection 4/

ratio

Input voltage range 4/ 6/

Gain bandwidth 4/ 7/

product

Symbol

Conditions 1/ 2/

-55ï°C ï£ TA ï£ +125ï°C

VS = ï±15 V

unless otherwise specified

AVCL = +1, RL ï³ 2 kï,

CL = 100 pF

CMRR

To 0.01 %, TA = +25ï°C

To 0.05 %, TA = +25ï°C

To 0.10 %, TA = +25ï°C

VCM = IVR = ï±10.2 V

PSRR VS = ï±10 V to ï±16 V

IVR

Group A Device

subgroups type

Limits

Min Max

01,04 10.0

5,6

7.5

02,03 7.5

5,6

5.0

All

3.0

2.1

1.8

All

2,3

01,04

02,03

2,3

All

100

1,2,3

All ï±10.2

Unit

V/ïs

ïs

ïV/V

ABW

TA = +25ï°C

All

3.5

MHz

1/ RHA devices supplied to this drawing have been characterized through all levels M, D, P, L, and R of irradiation.

However, this device is only tested at the âRâ level. Pre and Post irradiation values are identical unless otherwise specified

in Table I. When performing post irradiation electrical measurements for any RHA level, TA = +25ï°C.

2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.

Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,

method 1019, condition A.

3/ TA = -55ï°C for IIO and IIB tests, subgroup 3, is guaranteed by TA = +25ï°C test.

4/ This parameter not tested post radiation.

5/ Settling time is defined here for a unity gain inverter connection using 2 kï resistors. It is the time required for the error

voltage (the voltage at the inverting input pin on the amplifier) to settle to within a specified percent of its final value from

the time a 10 V step input is applied to the inverter.

6/ IVR test is defined as the VCM range used for the CMRR test.

7/ Parameter guaranteed if not tested to the limits specified.

STANDARD

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

SIZE

REVISION LEVEL

5962-88538

SHEET

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