5962-8853801VGA Datasheet, PDF (10/14 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, LINEAR, DUAL PRECISION JFET-INPUT OPERATIONAL AMPLIFIERS MONOLITHIC SILICON

TABLE IIA. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
1
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class Q
1
Device
class V
1
1,2,3,4,5,6 1/
1,2,3,4,5,6,9
1,2,3,4,5,6 1/
1,2,3,4,5,6,9
1,2,3, 1/ 2/
4,5,6
1,2,3,4,5,6,9
1
1
1 2/
1
1
1
---
---
1,4
1/ PDA applies to subgroup 1.
2/ Delta limits as specified in table IIB shall be required where specified and the delta limits
shall be computed with reference to the previous interim electrical parameters.
TABLE IIB. Burn-in and operating life test delta parameters. 1/ 2/
Test
Device
Limit
Delta
Unit
type
Min
Max
Min
Max
V_OS
01,04
-2.0
+2.0
-1.0
+1.0
mV
02
-3.0
+3.0
-1.0
+1.0
03
-5.0
+5.0
-1.0
+1.0
I_IB
01,04
-150
+150
-75
+75
pA
02
-300
+300
-100
+100
03
-450
+450
-150
+150
1/ Deltas are performed at room temperature. T_A = +25C.
2/ 240 hour burn-in and 1,000 hour operating group C life test.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
G
5962-88538
SHEET
10