CB2012T2R2M Datasheet, PDF (15/16 Pages) List of Unclassifed Manufacturers – WOUND CHIP INDUCTORS

RELIABILITY DATAɹ
8/8
Specified Value
Item
LEM2520
LB2518
LB2016
LB2012
LB1608
LBC2518
LBC2016
LBC2012
CB2518
CB2016
CB2012
CBC3225
CBC2518
CBC2016
CBC2012
CBL2012
LBH1608
Test Methods and Remarks
23.Low temperature ˚L/Lˠ
˚L/LˠWithinM10L
˚L/Lˠ
LEMYLBYLBCYCBYCBCYCBLYLBH
life test
WithinM10L
WithinM5L
TemperatureɿK40M2C
QË 
˞˚L/Lˠ
Durationɿ1000 hrs
10NÉ¿10min.
withinM0.5nH RecoveryɿAt least 1 hr of recovery the stan-
12NV33NÉ¿
15min.
39NVR10É¿
under 8.2̽H
˚Q/Qˠ
WithinM20L
dard condition after the removal
from test chamber, followed by
5
measurement within 2 hrs.
20min.
˞˚Q/Qˠ
R12V4R7É¿
withinM5 under
30min.
8.2̽H
5R6V330É¿
25min.
390V820É¿
20min.
101É¿15min.
24.Standard condition "Sutandard con- Standard test conditionɿUnless oherwise specified,Temperature20M15ˆof temperature, 65M20L of relative
dition" referred humidity.When there are question concerning measurement resultɿIn order to provide correlation date, the test shall
to herein de- be condition of 20M2ˆ of tenterature, 65M5L relative humidity.
f i n e d a s Inductance is in accordance with our measured value.
followsɿ5 to 35
ˆ of tempera-
ture, 45 to 85%
relative humid-
ity, and 86 to
106kPa of air
pressure.When
there are ques-
tions concerning
measurement
resultsɿIn or-
der to provide
correlation data,
the test shall be
conducted un-
der condition of
20M2ˆ of tem-
perature, 45 to
85L to 106kPa
of air pressure.
Unless other-
wise specified
all the test are
conducted un-
der the "stan-
dard condition"
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