CB2012T2R2M Datasheet, PDF (14/16 Pages) List of Unclassifed Manufacturers – WOUND CHIP INDUCTORS

RELIABILITY DATAɹ
7/8
Specified Value
Item
LEM2520
LB2518
LB2016
LB2012
LB1608
LBC2518
LBC2016
LBC2012
CB2518
CB2016
CB2012
CBC3225
CBC2518
CBC2016
CBC2012
CBL2012
LBH1608
Test Methods and Remarks
20.Loading under ˚L/Lˠ
˚L/LˠWithinM10L
˚L/Lˠ
LEMYLBYLBCYCBYCBCYCBLÉ¿
damp heat
WithinM10L
WithinM5L
Temperatureɿ60M2C fExcluding nH rangeg
QË 
˞˚L/Lˠ
Humidityɿ90V95LRH
R12V4R7É¿
withinʶ0.5nH Durationɿ1000 hrs
30min.
5R6V330É¿
25min.
under 8.2̽H Applied currentɿRated current
˚Q/Qˠ
RecoveryɿAt least 1 hr of recovery the stan-
5
withinM20L
dard condition after the removal
390V820É¿
˞˚Q/Qˠ
from test chamber, followed by
20min.
withinM5 under
measurement within 2 hrs.
101É¿15min.
8.2̽H
21.High temperaturte
life test
˚L/Lˠ
WithinM10L
QË 
10NÉ¿10min.
12NV33NÉ¿
15min.
39NVR10É¿
20min.
R12V4R7É¿
30min.
5R6V330É¿
25min.
390V820É¿
20min.
101É¿15min.
˚L/LˠWithinM10L
LEMYCBYCBCYCBLÉ¿
Temperatureɿ85M2C
Durationɿ1000 hrs
RecoveryɿAt least 1 hr of recovery the stan-
dard condition after the removal
from test chamber, followed by
measurement within 2 hrs.
22.Loading at high
temperature
˚L/LˠWithinM10L
˚L/Lˠ
WithinM5L
˞˚L/Lˠ
withinM0.5nH
under
8.2̽H
˚Q/Qˠ
WithinM20L
˞˚Q/Qˠ
withinM0.5
under 8.2̽H
LBYLBCÉ¿
Temperatureɿ85M2C fExcluding nH rangeg
Durationɿ1000 hrs
Applied currentɿRated current
RecoveryɿAt least 1 hr of recovery the stan-
dard condition after the removal
from test chamber, followed by
measurement within 2 hrs.
209