CB2012T2R2M Datasheet, PDF (13/16 Pages) List of Unclassifed Manufacturers – WOUND CHIP INDUCTORS

RELIABILITY DATA
6/8
Specified Value
Item
LEM2520
LB2518
LB2016
LB2012
LB1608
LBC2518
LBC2016
LBC2012
CB2518
CB2016
CB2012
CBC3225
CBC2518
CBC2016
CBC2012
CBL2012
LBH1608
Test Methods and Remarks
18.Thermal shock ˚L/Lˠ
˚L/LˠWithinM10L
˚L/Lˠ
Conditions for 1cycle
WithinM10L
WithinM5L
Step TemperaturefCg Durationfming
QË 
˞˚L/Lˠ
1
K40
30
10NÉ¿10min.
withinM0.5nH
2
J85
30
12NV33NÉ¿
15min.
39NVR10É¿
under
8.2̽H
Temperature forɿLEM2520
5
˚Q/Qˠ
20min.
withinM20L
Number of cycleɿ100 cycle
R12V4R7É¿
˞˚Q/Qˠ
RecoveryɿAt least 1 hr of recovery the stan-
30min.
withinM5 under
dard condition after the removal
5R6V330É¿
8.2̽H
from test chamber, followed by
25min.
measurement within 2 hrs.
390V820É¿
20min.
LBYLBCYCBYCBCYCBLYLBHÉ¿
101É¿15min.
K40VJ85C, miantain times 30min. ,100 cycle
RecoveryɿAt least 1 hr of recovery under
the standard condition after the
test, followed by the measure-
ment within 2 hrs.
19.Damp heat
˚L/Lˠ
WithinM10L
QË 
10NÉ¿10min.
12NV33NÉ¿
15min.
39NVR10É¿
20min.
R12V4R7É¿
30min.
5R6V330É¿
25min.
390V820É¿
20min.
101É¿15min.
˚L/LˠWithinM10L
˚L/Lˠ
WithinM5L
˞˚L/Lˠ
withinM0.5nH
under
8.2̽H
˚Q/Qˠ
WithinM20L
˞˚Q/Qˠ
withinM5 under
8.2̽H
Temperatureɿ60M2C
Humidityɿ90V95LRH
Durationɿ1000 hrs
RecoveryɿAt least 1 hr of recovery the stan-
dard condition after the removal
from test chamber, followed by
measurement within 2 hrs.
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