M38510-101J Datasheet, PDF (14/43 Pages) List of Unclassifed Manufacturers – MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

MIL-M-38510/101J
TABLE II. Electrical test requirements.
MIL-PRF-38535
test requirements
Interim electrical parameters
Subgroups (see table III)
Class S
devices
1
Class B
devices
1
Final electrical test parameters 1/ 1,2,3,4
1,2,3,4
Group A test requirements
Group C end point electrical
parameters
Additional electrical subgroups
For group C periodic inspections
Group D end point electrical
parameters
1,2,3,4,5,6,
7,8A,8B,12,
13A,13B
1,2,3, and
table IV delta
limits
Not applicable
1,2,3
1,2,3,4,5,6,7
1 and table IV
delta limits
8A,8B,12,
13A,13B
1
1/ PDA applies to subgroup 1.
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as
modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to
qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained
under document control by the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test
prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535.
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