M38510-101J Datasheet, PDF (13/43 Pages) List of Unclassifed Manufacturers – MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

Test
Noise (referred to input)
broadband
Noise (referred to input)
popcorn
MIL-M-38510/101J
TABLE I. Electrical performance characteristics – Continued. 1/
Symbol
NI(BB)
Conditions
-55°C ≤ T_A ≤ +125°C
see figure 3
unless otherwise specified
±V_CC = 20 V, T_A = +25°C,
bandwidth = 5 kHz
Group A Device
subgroups type
7
01-06,
08
07
Limits
Min Max
15
25
Unit
µVrms
NI(PC)
±V_CC = 20 V, T_A = +25°C,
bandwidth = 5 kHz
7
01,02,
04,06,
08
03,05,
07
40 µVpk
80
1/ For devices marked with the “Q” certification mark, the parameters listed herein maybe guaranteed if not tested
to the limits specified herein in accordance with the manufacturer’s QM plan.
2/ Tests at common mode V_CM = 0 V, V_CM = -15 V, and V_CM = +15 V.
3/ V_IO(ADJ) is not performed on device type 02, case I only, or on device type 08 for either case G or P.
4/ Continuous short circuit limits will be considerably less than the indicated test limits. Continuous I_OS at T_A ≤ +75°C
will cause T_J to exceed the maximum of +175°C. For dual devices, I_OS is measured one channel at a time.
5/ Value shown is for single devices (01, 03, 04) only. For dual devices (02, 05, 06, and 08) this limit is for single
devices.
6/ Note that gain is not specified at V_IO(ADJ) extremes. Some gain reduction is usually seen at V_IO(ADJ) extremes.
For closed loop applications (closed loop gain less than 1,000), the open loop tests (AVS) prescribed herein should
guarantee a positive, reasonably linear, transfer characteristic. They do not, however, guarantee that the open
loop gain is linear, or even positive, over the operating range. If either of these requirements exist (positive open
loop gain or open loop gain linearity), they should be specified in the individual procurement document as
additional requirements.
7/ R_L = 10 kΩ only for device types 04 and 06.
8/ For transient response tests, C_F = 10 pF for device types 01, 02, 03, 04, 05, 06, and 08. Device type 07,
C_F = 47 pF. C_F includes the effects of stray capacitance.
9/ Minimum limit for device 08 is 0.4 V/µs at all temperatures.
10/ Minimum limits for device types 03 and 05 are 0.2 V/µs at -55°C and 0.3 V/µs at both +25°C and +125°C.
11/ Settling time is waived for method 5004, MIL-STD-883 except for device type 07.
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