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N04L163WC1C Datasheet, PDF (4/10 Pages) List of Unclassifed Manufacturers – 4Mb Ultra-Low Power Asynchronous CMOS SRAM
NanoAmp Solutions, Inc.
N04L163WC1C
Advance Information
Timing Test Conditions
Item
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
Operating Temperature
0.1VCC to 0.9 VCC
1V/ns
0.5 VCC
CL = 50pF
-40 to +85 oC
Timing
Item
Read Cycle Time
Address Access Time
Chip Enable to Valid Output
Output Enable to Valid Output
Byte Select to Valid Output
Chip Enable to Low-Z output
Output Enable to Low-Z Output
Byte Select to Low-Z Output
Chip Disable to High-Z Output
Output Disable to High-Z Output
Byte Select Disable to High-Z Output
Output Hold from Address Change
Symbol
tRC
tAA
tCO
tOE
tLB, tUB
tLZ
tOLZ
tLBZ, tUBZ
tHZ
tOHZ
tLBHZ, tUBHZ
tOH
-55
Min.
Max.
55
55
55
25
55
10
5
10
0
20
0
20
0
20
10
Write Cycle Time
Chip Enable to End of Write
Address Valid to End of Write
Byte Select to End of Write
Write Pulse Width
Address Setup Time
Write Recovery Time
Write to High-Z Output
Data to Write Time Overlap
Data Hold from Write Time
End Write to Low-Z Output
tWC
55
tCW
40
tAW
40
tLBW, tUBW
40
tWP
40
tAS
0
tWR
0
tWHZ
20
tDW
25
tDH
0
tOW
10
Note:
1. Full device AC operation assumes a 100us ramp time from 0 to Vcc(min) and 200us wait time after Vcc stablization.
2. Full device operation requires linear Vcc ramp from VDR to Vcc(min) ≥ 100us or stable at Vcc(min) ≥ 100us.
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Stock No. 23373-C 1/05
4
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.