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EN29F080 Datasheet, PDF (21/37 Pages) List of Unclassifed Manufacturers – 8 Megabit (1024K x 8-bit) Flash Memory
Test Conditions
Device Under Test
CL
EN29F080
5.0 V
2.7 kΩ
6.2 kΩ
Note: Diodes are IN3064 or equivalent
Test Specifications
Test Conditions
Output Load
Output Load Capacitance, CL
Input Rise and Fall times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
-45
-55
-70
-90
Unit
1 TTL Gate
30
30
100
100
pF
5
5
20
20
ns
0.0-0.3 0.0-0.3 0.45-2.4 0.45-2.4
V
1.5
1.5
0.8, 2.0 0.8, 2.0
V
1.5
1.5
0.8, 2.0 0.8, 2.0
V
4800 Great America Parkway, Suite 202
21
Santa Clara, CA 95054
Rev. C, Issue Date: 2001/07/05
Tel: 408-235-8680
Fax: 408-235-8685