CCD30-11 Datasheet, PDF (2/9 Pages) List of Unclassifed Manufacturers – Open Electrode High Performance CCD Sensor

PERFORMANCE
Peak charge storage (see note 1)
Peak output voltage (unbinned)
Dark signal at 293 K (see note 2)
Charge transfer efficiency (see note 3):
parallel
serial
Output amplifier sensitivity
Readout noise at 140 K (see note 4)
Readout frequency (see note 5)
Response non-uniformity (std. deviation)
Dark signal non-uniformity at 293 K
(std. deviation)
Output node capacity
relative to image section
Min
200k
–
–
–
–
1.3
–
–
–
–
–
Typical
300k
450
250
99.9999
99.9993
1.8
4
20
3
100
4.0
Max
–
–
500
–
–
2.3
6
5000
10
200
–
e⁷/pixel
mV
e⁷/pixel/s
%
%
mV/e⁷
rms e⁷/pixel
kHz
% of mean
e⁷/pixel/s
ELECTRICAL INTERFACE CHARACTERISTICS
Electrode capacitances (measured at mid-clock level):
Min
Typical
Max
I1/I1 interphase
R1/R1 interphase
I1/SS
R1/SS
Output impedance
–
2.0
–
nF
–
70
–
pF
–
11
–
nF
–
185
–
pF
–
300
–
O
NOTES
1. Signal level at which resolution begins to degrade.
2. The typical average (background) dark signal at any
temperature T (kelvin) between 230 and 300 K is given by:
Q_d/Q_d0 = 1.14 x 10⁶T³e^79080/T
where Q_d0 is the dark current at 293 K. Note that this is
typical performance and some variation may be seen
between devices. Below 230 K additional dark current
components with a weaker temperature dependence may
become significant.
3. CCD characterisation measurements made using charge
generated by X-ray photons of known energy.
4. Measured using a dual-slope integrator technique (i.e.
correlated double sampling) with a 10 ms integration period.
5. Readout above 5000 kHz can be achieved but performance
to the parameters given cannot be guaranteed.
BLEMISH SPECIFICATION
Traps
Pixels where charge is temporarily held.
Traps are counted if they have a capacity
greater than 200 e⁷ at 233 K.
Slipped columns Are counted if they have an amplitude
greater than 200 e⁷.
Black spots
Are counted when they have a responsivity
of less than 90% of the local mean signal
illuminated at approximately half saturation.
White spots
White column
Black column
Are counted when they have a generation
rate 100 times the specified maximum dark
signal generation rate at 293 K (measured
between 233 and 273 K). The typical
temperature dependence of white spot
blemishes is different from that of the
average dark signal and is given by:
Q_d/Q_d0 = 122T³e^76400/T
A column which contains at least 9 white
defects.
A column which contains at least 9 black
defects.
GRADE
Column defects:
black or slipped
white
Black spots:
53 pixels
55 pixels
510 pixels
410 pixels
Traps 4200 e⁷
White spots
0
1
2
0
1
6
0
0
0
2
3
15
1
2
8
0
0
1
0
0
0
1
2
5
10
10
15
Minimum separation between
adjacent black columns . . . . . . . . . 50 pixels
Note The effect of temperature on defects is that traps will be
observed less at higher temperatures but more may appear
below 233 K. The amplitude of white spots and columns will
decrease rapidly with temperature.
100008, page 2
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