EN25QH32 Datasheet, PDF (55/63 Pages) Eon Silicon Solution Inc. – 32 Megabit Serial Flash Memory with 4Kbyte Uniform Sector

Table 15. DATA RETENTION and ENDURANCE
Parameter Description
Data Retention Time
Erase/Program Endurance
Test Conditions
150°C
125°C
-40 to 85 °C
EN25QH32
Min
10
20
100k
Unit
Years
Years
cycles
Table 16. CAPACITANCE
( V_CC = 2.7-3.6V)
Parameter Symbol
C_IN
Parameter Description
Input Capacitance
Test Setup
V_IN = 0
Max
6
Unit
pF
C_OUT
Output Capacitance
V_OUT = 0
8
pF
Note : Sampled only, not 100% tested, at TA = 25°C and a frequency of 20MHz.
This Data Sheet may be revised by subsequent versions
55
or modifications due to changes in technical specifications.
©2004 Eon Silicon Solution, Inc.,
Rev. E, Issue Date: 2012/01/30
www.eonssi.com