EN25F32 Datasheet, PDF (34/40 Pages) Eon Silicon Solution Inc. – 32 Megabit Serial Flash Memory with 4Kbytes Uniform Sector

Table 12. DATA RETENTION and ENDURANCE
EN25F32
Parameter Description
Data Retention Time
Erase/Program Endurance
Test Conditions
150°C
125°C
-40 to 85 °C
Min
10
20
100k
Unit
Years
Years
cycles
Table 13. CAPACITANCE
( V_CC = 2.7-3.6V)
Parameter Symbol
Parameter Description
Test Setup
Typ
Max
Unit
C_IN
Input Capacitance
V_IN = 0
6
pF
C_OUT
Output Capacitance
V_OUT = 0
8
pF
Note : Sampled only, not 100% tested, at TA = 25°C and a frequency of 20MHz.
This Data Sheet may be revised by subsequent versions
34 ^{©2004 Eon Silicon Solution, Inc.,}
or modifications due to changes in technical specifications.
Rev. G, Issue Date: 2009/10/16
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