MA31755 Datasheet, PDF (8/13 Pages) Dynex Semiconductor – 16-Bit Feedthrough Error Detection & Correction Unit EDAC

MA31755
Subgroup
1
2
3
7
8A
8B
9
10
11
Definition
Static characteristics specified in Figure 12 at +25°C
Static characteristics specified in Figure 12 at +125°C
Static characteristics specified in Figure 12 at -55°C
Functional characteristics specified at +25°C
Functional characteristics specified at +125°C
Functional characteristics specified at -55°C
Switching characteristics specified in Figure 10 at +25°C
Switching characteristics specified in Figure 10 at +125°C
Switching characteristics specified in Figure 10 at -55°C
Figure 13: Definition of Subgroups
6. APPLICATIONS INFORMATION
CLK
TCLK
RESETN
VDD
PWRDN
INT02N
INT08N
INT10N
INT11N
INT13N
INT15N
IOI1N
IOI2N
MA31750
MPROEN
PEN
EXADEN
FLT7N
SYSFN
CLK
TCLK
ABN
DPARN
DTON
CONREQN
RESETN
GND
A[0-15]
D[0-16]
ASTB
ASTB
DSN
M/ION
DSN
M/ION
RDWN
R/WN
O/IN
RDN
O/IN
RDN
WRN
WRN
RDYN ^RDYN
PD[0:16]
RDWN
SUREN
TGON
INTAKN
NPU
ILLADN
AS[0-3]
PS[0-3]
PB[0-3]
VDD0-3
PD[0:16]
MD[0:16]
CB[0:5]
RDWN
ENMDN
ENPDN
MA31755
CS2N
CS1N
CS0
VSS0-3
XERRN
CERRN
NCERRN
To memory system
CONTROL
A[0-15]
MD[0:16]
CB[0:5]
XERRN
Figure 14: Basic System Diagram for the MA31755 with the MA31750
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