MA7001 Datasheet, PDF (5/15 Pages) Dynex Semiconductor – Radiation Hard 512x9 Bit FIFO

Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
GND to 3.0V
5ns
1.5V
1.5V
See Figure 7
Figure 5: AC Test Conditions
MA7001
Output
under test
Test Point
≤50pF*
LOAD 1
* Includes jig
and scope
capacitances
Figure 7: Output Load
Symbol Parameter
Conditions
Max.
Unit
C_IN
C_OUT
Input Capacltance (Note 1)
Output Capacitance (Notes 1 and 2)
V_IN = 0V
V_OUT = 0V
7
pF
12
pF
NOTES:
1. Characterized values, not currently tested.
2. With output deselected.
Figure 6: Capacitance
TRUTH TABLES
Operation
Input
Output
Pointer
R W RS RT Xl EF FF Data Read
Write
Reset
1
1
0
x
0
0
1
Z
Zero
Zero
Retransmit*
1
1
1
0
0
1
1
Z
Zero
N/C
Read
1→0 x
1
1
0
1
1 valid Increment
N/C
Read
x
x
1
1
0
0
1
Z
N/C
N/C
Write
x 1→0 1
1
0
x
1
x
N/C
Increment
Write
x
x
1
1
0
1
0
x
N/C
N/C
* Only available if less than 512 writes since last reset.
Figure 8: Single Device or Width Expansion: Read, Write, Reset and Retransmit
Operation
Reset First
Reset Rest
Input
Output
Pointer
R W RS FL Xl EF FF Data Read
Write
1
1
0
0
1
0
1
Z
1
1
0
1
1
0
1
Z
Zero
Zero
Zero
Zero
NOTES:
1. See Modes of Operation for connections of Xl and XO in depth expansion mode.
2. XI is connected to XO of previous device (Figure 12).
Figure 9: Depth Expansion: Reset and First Load
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